Richard Putman

According to our database, Richard Putman authored at least 4 papers between 2006 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation.

Ritesh Garg, Richard Putman, Nur A. Touba

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Using reiterative LFSR based X-masking to increase output compression in presence of unknowns.

Richard Putman

Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, 2008

2007

Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression.

Richard Putman, Nur A. Touba

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Enhanced Timing-Based Transition Delay Testing for Small Delay Defects.

Richard Putman, Rahul Gawde

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006