Richard Morren

According to our database, Richard Morren authored at least 6 papers between 1992 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2013

Industrial Application of IEEE P1687 for an Automotive Product.

Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

2010

Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains.

Tom Waayers, Richard Morren, Xijiang Lin, Mark Kassab

Proceedings of the 2011 IEEE International Test Conference, 2010

2005

Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain.

Tom Waayers, Richard Morren, Roberto Grandi

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

1993

Mix Test: A Mixed-Signal Extension to a Digital Test System.

R. Mehtani, Bert Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Using EDIF for Transfer of Test Data: Practical Experience.

Bas Verhelst, Richard Morren, Keith Baker

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Improving Total IC Design Quality Using Application Mode Testing.

R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992