Richard Lossy
Orcid: 0000-0002-0711-0945
According to our database1,
Richard Lossy
authored at least 7 papers
between 2004 and 2018.
Collaborative distances:
Collaborative distances:
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Bibliography
2018
Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018
2014
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery.
Microelectron. Reliab., 2014
2012
Microelectron. Reliab., 2012
2011
Microelectron. Reliab., 2011
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements.
Microelectron. Reliab., 2011
2009
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
Microelectron. Reliab., 2009
2004