Richard Lallemand
According to our database1,
Richard Lallemand
authored at least 8 papers
between 2001 and 2017.
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Bibliography
2017
Microelectron. Reliab., 2017
2016
Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions.
Microelectron. Reliab., 2016
2014
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test.
Microelectron. Reliab., 2014
Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage.
Proceedings of the 23rd IEEE International Symposium on Industrial Electronics, 2014
2010
IEEE Trans. Ind. Electron., 2010
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode.
Microelectron. Reliab., 2010
2003
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC.
Microelectron. Reliab., 2003
2001
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter.
Microelectron. Reliab., 2001