Richard J. T. Simms

According to our database1, Richard J. T. Simms authored at least 1 paper in 2011.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2011
AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes.
Microelectron. Reliab., 2011


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