Riccardo Depetro

According to our database, Riccardo Depetro authored at least 4 papers between 2017 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors.

Andrea Natale Tallarico, Susanna Reggiani, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

TCAD predictions of hot-electron injection in p-type LDMOS transistors.

Federico Giuliano, Riccardo Depetro, Giuseppe Croce, Andrea Natale Tallarico, Susanna Reggiani, Antonio Gnudi, Enrico Sangiorgi, Claudio Fiegna, Mattia Rossetti, Antonio Molfese, Stefano Manzini

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018

TCAD investigation on hot-electron injection in new-generation technologies.

Susanna Reggiani, Mattia Rossetti, Antonio Gnudi, Andrea Natale Tallarico, Antonio Molfese, Stefano Manzini, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna

Microelectron. Reliab., 2018

2017

Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide.

Andrea Natale Tallarico, Susanna Reggiani, Paolo Magnone, Giuseppe Croce, Riccardo Depetro, P. Gattari, Enrico Sangiorgi, Claudio Fiegna

Microelectron. Reliab., 2017