Ricardo Olivo

According to our database, Ricardo Olivo authored at least 16 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Ferroelectric Field Effect Transistors-Based Content-Addressable Storage-Class Memory: A Study on the Impact of Device Variation and High-Temperature Compatibility.

Athira Sunil, Masud Rana SK, Maximilian Lederer, Yannick Raffel, Franz Müller, Ricardo Olivo, Raik Hoffmann, Konrad Seidel, Thomas Kämpfe, Bhaswar Chakrabarti, Sourav De

Adv. Intell. Syst., April, 2024

Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions.

Maximilian Lederer, Franz Müller, Raik Hoffmann, Ricardo Olivo, Yannick Raffel, Shouzhuo Yang, Sourav De, Roman Potjan, Oliver Ostien, Abdelrahman Altawil, Ayse Sünbül, David Lehninger, Thomas Kämpfe, Konrad Seidel

Proceedings of the IEEE International Memory Workshop, 2024

2023

An Ultracompact Single-Ferroelectric Field-Effect Transistor Binary and Multibit Associative Search Engine.

Xunzhao Yin, Franz Müller, Qingrong Huang, Chao Li, Mohsen Imani, Zeyu Yang, Jiahao Cai, Maximilian Lederer, Ricardo Olivo, Nellie Laleni, Shan Deng, Zijian Zhao, Zhiguo Shi, Yiyu Shi, Cheng Zhuo, Thomas Kämpfe, Kai Ni

Adv. Intell. Syst., July, 2023

Multi-Level Operation of Ferroelectric FET Memory Arrays for Compute-In-Memory Applications.

Franz Müller, Sourav De, Maximilian Lederer, Raik Hoffmann, Ricardo Olivo, Thomas Kämpfe, Konrad Seidel, Tarek Ali, Halid Mulaosmanovic, Stefan Dünkel, Johannes Müller, Sven Beyer, Gerald Gerlach

Proceedings of the IEEE International Memory Workshop, 2023

Ferroelectric HfO2/ZrO2 Superlattices with Improved Leakage at Bias and Temperature Stress.

David Lehninger, Ayse Sünbül, Ricardo Olivo, Thomas Kämpfe, Konrad Seidel, Maximilian Lederer

Proceedings of the IEEE International Memory Workshop, 2023

2022

An Ultra-Compact Single FeFET Binary and Multi-Bit Associative Search Engine.

Xunzhao Yin, Franz Müller, Qingrong Huang, Chao Li, Mohsen Imani, Zeyu Yang, Jiahao Cai, Maximilian Lederer, Ricardo Olivo, Nellie Laleni, Shan Deng, Zijian Zhao, Cheng Zhuo, Thomas Kämpfe, Kai Ni

CoRR, 2022

Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination.

Yannick Raffel, Ricardo Olivo, Maximilian Lederer, Franz Müller, Raik Hoffmann, Tarek Ali, Konstantin Mertens, Luca Pirro, Maximilian Drescher, Sven Beyer, Thomas Kämpfe, Konrad Seidel, Lukas M. Eng, Johannes Heitmann

Proceedings of the IEEE International Memory Workshop, 2022

Integration of BEoL Compatible 1T1C FeFET Memory Into an Established CMOS Technology.

David Lehninger, Hannes Mähne, Tarek Ali, Raik Hoffmann, Ricardo Olivo, Maximilian Lederer, Konstantin Mertens, Thomas Kämpfe, Kati Biedermann, Matthias Landwehr, Andreas Heinig, Defu Wang, Yukai Shen, Kerstin Bernert, Steffen Thiem, Konrad Seidel

Proceedings of the IEEE International Memory Workshop, 2022

Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability.

Tarek Ali, Ricardo Olivo, S. Kerdilès, David Lehninger, Maximilian Lederer, Sourav De, A.-S. Royet, Ayse Sünbül, A. Prabhu, Kati Kühnel, Malte Czernohorsky, M. Rudolph, Raik Hoffmann, Christelle Charpin-Nicolle, Laurent Grenouillet, Thomas Kämpfe, Konrad Seidel

Proceedings of the IEEE International Memory Workshop, 2022

Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications.

Yannick Raffel, Sunanda Thunder, Maximilian Lederer, Ricardo Olivo, Raik Hoffmann, Luca Pirro, Sven Beyer, Talha Chohan, Po-Tsang Huang, Sourav De, Thomas Kämpfe, Konrad Seidel, Johannes Heitmann

Proceedings of the International Conference on IC Design and Technology, 2022

2021

Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices.

Luca Pirro, Aarthi Jayakumar, Olaf Zimmerhackl, Dieter Lipp, Ralf Illgen, Armin Muehlhoff, Ronny Pfuetzner, Alban Zaka, Michael Otto, Jan Hoentschel, Yannick Raffel, Konrad Seidel, Ricardo Olivo

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Exploiting FeFET Switching Stochasticity for Low-Power Reconfigurable Physical Unclonable Function.

Xinrui Guo, Xiaoyang Ma, Franz Müller, Ricardo Olivo, Juejian Wu, Kai Ni, Thomas Kämpfe, Yongpan Liu, Huazhong Yang, Xueqing Li

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

In-Memory Nearest Neighbor Search with FeFET Multi-Bit Content-Addressable Memories.

Arman Kazemi, Mohammad Mehdi Sharifi, Ann Franchesca Laguna, Franz Müller, Ramin Rajaei, Ricardo Olivo, Thomas Kämpfe, Michael T. Niemier, X. Sharon Hu

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

A Ferroelectric FET Based In-memory Architecture for Multi-Precision Neural Networks.

Taha Soliman, Ricardo Olivo, Tobias Kirchner, Maximilian Lederer, Thomas Kämpfe, Andre Guntoro, Norbert Wehn

Proceedings of the 33rd IEEE International System-on-Chip Conference, 2020

Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells.

Tarek Ali, Kati Kühnel, Malte Czernohorsky, Matthias Rudolph, Björn Pätzold, Ricardo Olivo, David Lehninger, Konstantin Mertens, Franz Müller, Maximilian Lederer, Raik Hoffmann, Clemens Mart, Mahsa N. Kalkani, Philipp Steinke, Thomas Kämpfe, Johannes Müller, Jan Van Houdt, Konrad Seidel, Lukas M. Eng

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Efficient FeFET Crossbar Accelerator for Binary Neural Networks.

Taha Soliman, Ricardo Olivo, Tobias Kirchner, Cecilia De la Parra, Maximilian Lederer, Thomas Kämpfe, Andre Guntoro, Norbert Wehn

Proceedings of the 31st IEEE International Conference on Application-specific Systems, 2020