Ri-an Zhao

According to our database, Ri-an Zhao authored at least 1 paper in 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2023

Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET.

Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan

Proceedings of the IEEE International Reliability Physics Symposium, 2023