Reza M. Rad
According to our database1,
Reza M. Rad
authored at least 17 papers
between 2006 and 2012.
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Bibliography
2012
Bit string analysis of Physical Unclonable Functions based on resistance variations in metals and transistors.
Proceedings of the 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 2012
2011
An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities.
IEEE Trans. Inf. Forensics Secur., 2011
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations.
Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011
2010
A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions.
IEEE Trans. Very Large Scale Integr. Syst., 2010
Detecting Trojans Through Leakage Current Analysis Using Multiple Supply Pad I<sub>DDQ</sub> s.
IEEE Trans. Inf. Forensics Secur., 2010
2009
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals.
J. Electron. Test., 2009
2008
ACM J. Emerg. Technol. Comput. Syst., 2008
Power supply signal calibration techniques for improving detection resolution to hardware Trojans.
Proceedings of the 2008 International Conference on Computer-Aided Design, 2008
Proceedings of the IEEE International Workshop on Hardware-Oriented Security and Trust, 2008
2007
Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
Evaluating area and performance of hybrid FPGAs with nanoscale clusters and CMOS routing.
ACM J. Emerg. Technol. Comput. Syst., 2007
2006
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, 2006
Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, 2006
Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006
Proceedings of the 43rd Design Automation Conference, 2006