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Renze Yu

Orcid: 0000-0002-4568-9513

According to our database1, Renze Yu authored at least 1 paper in 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of six.

Timeline

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Bibliography

2024
Impact of Intrinsic Parameter Dispersion on Short-Circuit Reliability of Parallel-Connected Planar and Trench SiC MOSFETs.
[BibTeX]
[DOI]
Renze Yu
,
Saeed Jahdi
,
Phil H. Mellor
IEEE Trans. Ind. Electron., December, 2024


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