Renjian Pan

ACM Trans. Design Autom. Electr. Syst., May, 2024

2023

Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2023

2022

Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021

Applying Machine Learning to Testing and Diagnosis of Integrated Systems.

[BibT_eX]

[DOI]

PhD thesis, 2021

Black-Box Test-Cost Reduction Based on Bayesian Network Models.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

Analog/RF Post-silicon Tuning via Bayesian Optimization.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2020

Fine-grained Adaptive Testing Based on Quality Prediction.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2020

Unsupervised Root-Cause Analysis for Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2020

2019

Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.

[BibT_eX]

[DOI]