Rene Krenz-Baath

According to our database, Rene Krenz-Baath authored at least 20 papers between 2007 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Human-heart-model for hardware-in-the-loop testing of pacemakers.

Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser

Comput. Biol. Medicine, 2024

2023

Verifying Bio-Electronic Systems.

Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser

Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2017

BASTION: Board and SoC test instrumentation for ageing and no failure found.

Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets.

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Computing optimal communication schedules for time-triggered networks using an SMT solver.

Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser

Proceedings of the 11th IEEE Symposium on Industrial Embedded Systems, 2016

Upper-bound computation for optimal retargeting in IEEE1687 networks.

Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson

Proceedings of the 2016 IEEE International Test Conference, 2016

A suite of IEEE 1687 benchmark networks.

Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Optimal SAT-based scheduler for time-triggered networks-on-a-chip.

Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser

Proceedings of the 10th IEEE International Symposium on Industrial Embedded Systems, 2015

Access time minimization in IEEE 1687 networks.

Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Optimization-based multiple target test generation for highly compacted test sets.

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler

Proceedings of the 19th IEEE European Test Symposium, 2014

Design, Verification, and Application of IEEE 1687.

Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Industrial Application of IEEE P1687 for an Automotive Product.

Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

Fault collapsing of multi-conditional faults.

Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs.

Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

A new SAT-based ATPG for generating highly compacted test sets.

Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2010

Defect-oriented cell-internal testing.

Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger

Proceedings of the 2011 IEEE International Test Conference, 2010

Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs.

Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler

Proceedings of the 15th European Test Symposium, 2010

2009

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.

Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson

Proceedings of the 2009 IEEE International Test Conference, 2009

2007

Dominator-based Algorithms in Logic Synthesis and Verification.

Rene Krenz-Baath

PhD thesis, 2007

Computation and Application of Absolute Dominators in Industrial Designs.

Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel

Proceedings of the 12th European Test Symposium, 2007