Rémi Gaillard

According to our database, Rémi Gaillard authored at least 6 papers between 2005 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices.

Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard

Microelectron. Reliab., 2012

2008

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node.

Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.

Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.

Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.

Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005