Ray Duffy
Orcid: 0000-0002-6362-3489Timeline
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Bibliography
2017
Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017
Impact of impurities, interface traps and contacts on MoS2 MOSFETs: Modelling and experiments.
Proceedings of the 47th European Solid-State Device Research Conference, 2017