Raphael Robertazzi

According to our database, Raphael Robertazzi authored at least 15 papers between 2004 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using Dense Addressable Arrays.

Raphael Robertazzi, David J. Frank, Kevin Tien, John Timmerwilke, Peilin Song, Daniel J. Friedman

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

2023

Low power cryogenic RF ASICs for quantum computing.

David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Chris Baks, John Timmerwilke, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

Proceedings of the IEEE Custom Integrated Circuits Conference, 2023

2022

A Cryo-CMOS Low-Power Semi-Autonomous Transmon Qubit State Controller in 14-nm FinFET Technology.

Sudipto Chakraborty, David J. Frank, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Devin Underwood, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Dorothy Wisnieff, Christian W. Baks, Donald S. Bethune, John Timmerwilke, Thomas Fox, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

IEEE J. Solid State Circuits, 2022

A Cryo-CMOS Low-Power Semi-Autonomous Qubit State Controller in 14nm FinFET Technology.

David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Christian W. Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

Proceedings of the IEEE International Solid-State Circuits Conference, 2022

A Cryo-CMOS Transmon Qubit Controller and Verification with FPGA Emulation.

Kevin Tien, Ken Inoue, Scott Lekuch, David J. Frank, Sudipto Chakraborty, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Devin Underwood, Dorothy Wisnieff, Christian W. Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2017

Analytical test of 3D integrated circuits.

Raphael Robertazzi, Micheal Scheurman, Matt Wordeman, Shurong Tian, Christy Tyberg

Proceedings of the IEEE International Test Conference, 2017

2016

Thermal analysis of multi-layer functional 3D logic stacks.

Michael Scheuermann, Shurong Tian, Raphael Robertazzi, Matthew R. Wordeman, C. Bergeron, H. Jacobson, Phillip J. Restle, Joel Silberman, Christy Tyberg

Proceedings of the 2016 IEEE International 3D Systems Integration Conference, 2016

2015

The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking.

Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban

IEEE J. Solid State Circuits, 2015

TSV/FET proximity study using dense addressable transistor arrays.

Raphael Robertazzi, Kanak Agarwal, Bucknell Webb, Christy Tyberg

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Analyzing path delays for accelerated testing of logic chips.

Emily Ray, Barry P. Linder, Raphael Robertazzi, Kevin Stawiasz, Alan J. Weger, Emmanuel Yashchin, James H. Stathis, Peilin Song

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Analytical MRAM test.

Raphael Robertazzi, Janusz Nowak, Jonathan Sun

Proceedings of the 2014 International Test Conference, 2014

5.2 Distributed system of digitally controlled microregulators enabling per-core DVFS for the POWER8^TM microprocessor.

Zeynep Toprak Deniz, Michael A. Sperling, John F. Bulzacchelli, Gregory S. Still, Ryan Kruse, Seongwon Kim, David Boerstler, Tilman Gloekler, Raphael Robertazzi, Kevin Stawiasz, Tim Diemoz, George English, David Hui, Paul Muench, Joshua Friedrich

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2010

New tools and methodology for advanced parametric and defect structure test.

Raphael Robertazzi, Louis Medina, Ernesto Shiling, Garry Moore, Ronald Geiger, Jiun-Hsin Liao, John Williamson

Proceedings of the 2011 IEEE International Test Conference, 2010

2006

A pulsed low-voltage swing latch for reduced power dissipation in high-frequency microprocessors.

Pong-Fei Lu, Nianzheng Cao, Leon J. Sigal, Pieter Woltgens, Raphael Robertazzi, David F. Heidel

Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006

2004

A high-speed 128-kb MRAM core for future universal memory applications.

John K. DeBrosse, Dietmar Gogl, Alexander Bette, Heinz Hoenigschmid, Raphael Robertazzi, Christian Arndt, Daniel Braun, D. Casarotto, Robert Havreluk, Stefan Lammers, Werner Obermaier, William R. Reohr, Hans Viehmann, William J. Gallagher, Gerhard Müller

IEEE J. Solid State Circuits, 2004