Rao Desineni

According to our database, Rao Desineni authored at least 11 papers between 2000 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Pylon: Towards an integrated customizable volume diagnosis infrastructure.

Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli

Proceedings of the 2016 IEEE International Test Conference, 2016

2013

Deriving Feature Fail Rate from Silicon Volume Diagnostics Data.

Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide

IEEE Des. Test, 2013

2010

Hard to find, easy to find systematics; just find them.

Rao Desineni, Leah Pastel, Maroun Kassab, Robert Redburn

Proceedings of the 2011 IEEE International Test Conference, 2010

2006

Defect Modeling Using Fault Tuples.

Ronald D. Blanton, Kumar N. Dwarakanath, Rao Desineni

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior.

Rao Desineni, Osei Poku, Ronald D. Blanton

Proceedings of the 2006 IEEE International Test Conference, 2006

Extraction of defect density and size distributions from wafer sort test results.

Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

Multiple-detect ATPG based on physical neighborhoods.

Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton

Proceedings of the 43rd Design Automation Conference, 2006

2005

Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction.

Rao Desineni, R. D. (Shawn) Blanton

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2004

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.

Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002

Fault Tuples in Diagnosis of Deep-Submicron Circuits.

Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Universal test generation using fault tuples.

Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000