Randolph E. Elmquist

According to our database, Randolph E. Elmquist authored at least 17 papers between 1999 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Graphene-Based Star-Mesh Resistance Networks.

Dean G. Jarrett, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi

IEEE Trans. Instrum. Meas., 2023

2020

Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe.

Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell

IEEE Trans. Instrum. Meas., 2020

Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices.

Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2020

2019

Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards.

Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist

IEEE Trans. Instrum. Meas., 2019

The units for mass, voltage, resistance, and electrical current in the SI.

Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist

IEEE Instrum. Meas. Mag., 2019

2015

Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study.

Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft

IEEE Trans. Instrum. Meas., 2015

Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard.

Yasuhiro Fukuyama, Randolph E. Elmquist, Lung-I Huang, Yanfei Yang, Fan-Hung Liu, Nobu-hisa Kaneko

IEEE Trans. Instrum. Meas., 2015

2013

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior.

Gert Rietveld, Jan H. N. van der Beek, Marlin Kraft, Randolph E. Elmquist, Alessandro Mortara, Beat Jeckelmann

IEEE Trans. Instrum. Meas., 2013

Graphene Epitaxial Growth on SiC(0001) for Resistance Standards.

Mariano A. Real, Eric A. Lass, Fan-Hung Liu, Tian Shen, George R. Jones, Johannes A. Soons, David B. Newell, Albert V. Davydov, Randolph E. Elmquist

IEEE Trans. Instrum. Meas., 2013

2009

SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ.

Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina

IEEE Trans. Instrum. Meas., 2009

Uncertainty Evaluation in a Two-Terminal Cryogenic Current Comparator.

M. E. Bierzychudek, Randolph E. Elmquist

IEEE Trans. Instrum. Meas., 2009

2005

Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator.

Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman

IEEE Trans. Instrum. Meas., 2005

2003

Using a high-value resistor in triangle comparisons of electrical standards.

Randolph E. Elmquist, Neil M. Zimmerman, William H. Huber

IEEE Trans. Instrum. Meas., 2003

2001

Transport behavior of commercially available 100-Ω standard resistors.

Bernd Schumacher, Peter Warnecke, Wilfrid Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinski

IEEE Trans. Instrum. Meas., 2001

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory.

Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2001

2000

Calculable coaxial resistors for precision measurements.

Randolph E. Elmquist

IEEE Trans. Instrum. Meas., 2000

1999

Cryogenic current comparator measurements at 77 K using thallium-2223 thick-film shields.

Randolph E. Elmquist

IEEE Trans. Instrum. Meas., 1999