Randall Rooney

According to our database1, Randall Rooney authored at least 1 paper in 2001.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2001
Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environment.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001


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