Rami F. Salem
According to our database1,
Rami F. Salem
authored at least 9 papers
between 2002 and 2013.
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Bibliography
2013
Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow.
IEEE Trans. Very Large Scale Integr. Syst., 2013
2012
Schematic-driven physical verification: Fully automated solution for analog IC design.
Proceedings of the IEEE 25th International SOC Conference, 2012
High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique.
Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012
2011
A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow.
Proceedings of the IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, 2011
Proceedings of the 6th IEEE International Design and Test Workshop, 2011
Yield enhancement flow for analog and full custom designs reliability-rules automatic application.
Proceedings of the 6th IEEE International Design and Test Workshop, 2011
2010
A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs.
Proceedings of the 5th International Design and Test Workshop, 2010
2003
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003
2002
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002