Ramez Nachman

According to our database, Ramez Nachman authored at least 1 paper in 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2005

The impact of PMOST bias-temperature degradation on logic circuit reliability performance.

Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal R. Mielke, Ramez Nachman

Microelectron. Reliab., 2005