Ramakrishna Voorakaranam

According to our database, Ramakrishna Voorakaranam authored at least 9 papers between 1997 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2007

Signature Testing of Analog and RF Circuits: Algorithms and Methodology.

Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee

IEEE Trans. Circuits Syst. I Regul. Pap., 2007

2004

Concurrent RF Test Using Optimized Modulated RF Stimuli.

Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results.

Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

A Signature Test Framework for Rapid Production Testing of RF Circuits.

Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 2002 Design, 2002

2000

Test Generation for Accurate Prediction of Analog Specifications.

Ramakrishna Voorakaranam, Abhijit Chatterjee

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

1999

Hierarchical Test Generation for Analog Circuits Using Incremental Test Development.

Ramakrishna Voorakaranam, Abhijit Chatterjee

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test.

Ramakrishna Voorakaranam, Abhijit Chatterjee

Proceedings of the 18th Conference on Advanced Research in VLSI (ARVLSI '99), 1999

1998

Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity.

Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis.

Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997