Ralf E.-H. Yee

According to our database, Ralf E.-H. Yee authored at least 2 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics.

Ralf E.-H. Yee, Nicholas Y.-J. Su, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

2021

AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening.

John Z.-L. Tang, Dave Y.-W. Lin, Ralf E.-H. Yee, Charles H.-P. Wen

Proceedings of the IEEE International Test Conference in Asia, 2021