Rajat Sinha
Orcid: 0000-0003-0169-2857
According to our database1,
Rajat Sinha
authored at least 2 papers
between 2018 and 2020.
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Bibliography
2020
Threshold Voltage Shift in a-Si: H Thin film Transistors under ESD stress Conditions.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications.
Proceedings of the IEEE International Reliability Physics Symposium, 2018