Rahul Kalyan

According to our database, Rahul Kalyan authored at least 2 papers between 2022 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes.

Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz

Proceedings of the IEEE International Test Conference, 2023

2022

Defect-Directed Stress Testing Based on Inline Inspection Results.

Chen He, Paul Grosch, Onder Anilturk, Joyce Witowski, Carl Ford, Rahul Kalyan, John C. Robinson, David W. Price, Jay Rathert, Barry Saville, Dave Lee

Proceedings of the IEEE International Test Conference, 2022