Raghuram S. Tupuri

According to our database, Raghuram S. Tupuri authored at least 10 papers between 1992 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

A Robust Top-Down Dynamic Power Estimation Methodology for Delay Constrained Register Transfer Level Sequential Circuits.

Sriram Sambamurthy, Jacob A. Abraham, Raghuram S. Tupuri

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

2006

Delay Constrained Register Transfer Level Dynamic Power Estimation.

Sriram Sambamurthy, Jacob A. Abraham, Raghuram S. Tupuri

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2006

2003

A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages.

Vivekananda M. Vedula, Jacob A. Abraham, Jayanta Bhadra, Raghuram S. Tupuri

J. Electron. Test., 2003

2002

A Comprehensive Fault Model for Deep Submicron Digital Circuits.

Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001

Timing Verification and Delay Test Generation for Hierarchical Designs.

Arun Krishnamachary, Jacob A. Abraham, Raghuram S. Tupuri

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

2000

Hierarchical Test Generation for Systems On a Chip.

Raghuram S. Tupuri, Jacob A. Abraham, Daniel G. Saab

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

1999

Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor.

Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham

Proceedings of the 36th Conference on Design Automation, 1999

1997

A Novel Hierarchical Test Generation Method for Processors.

Raghuram S. Tupuri, Jacob A. Abraham

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

A Novel Functional Test Generation Method for Processors Using Commercial ATPG.

Raghuram S. Tupuri, Jacob A. Abraham

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1992

Design Migration Across Technology - Making It Work.

Soumitra De Sirkar, Raghuram S. Tupuri, C. Sudha Madhuri, G. Rajagopalan, Kalpesh D. Mehta, C. G. Madhukar, Giridhar Bajpe

Proceedings of the Fifth International Conference on VLSI Design, 1992