Ragh Kuttappa
Orcid: 0000-0003-1022-2187
According to our database1,
Ragh Kuttappa
authored at least 22 papers
between 2016 and 2024.
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Bibliography
2024
A 3.2GHz-15GHz Low Jitter Resonant Clock Featuring Rotary Traveling Wave Oscillators in Intel 4 CMOS for 3D Heterogeneous Multi-Die Systems.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
2022
IEEE Trans. Very Large Scale Integr. Syst., 2022
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
A 0.45 pJ/bit 20 Gb/s/Wire Parallel Die-to-Die Interface with Rotary Traveling Wave Oscillators.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
2021
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021
2020
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
Proceedings of the IEEE International Symposium on High Performance Computer Architecture, 2020
2019
IEEE Trans. Circuits Syst. I Regul. Pap., 2019
IEEE Trans. Circuits Syst. I Regul. Pap., 2019
Distributed Digital Low-Dropout Regulators with Phase Interleaving for On-Chip Voltage Noise Mitigation.
Proceedings of the 21st ACM/IEEE International Workshop on System Level Interconnect Prediction, 2019
Proceedings of the 13th IEEE/ACM International Symposium on Networks-on-Chip, 2019
Proceedings of the 2019 IEEE/ACM International Symposium on Low Power Electronics and Design, 2019
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging.
Microelectron. Reliab., 2016
Comparative analysis of robustness of spin transfer torque based look up tables under process variations.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016