R. Ramamurthy

According to our database, R. Ramamurthy authored at least 4 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Record Performance in GAA 2D NMOS and PMOS Using Monolayer MoS2 and WSe2 with Scaled Contact and Gate Length.

W. Mortelmans, P. Buragohain, C. Rogan, A. Kitamura, C. J. Dorow, K. P. O'Brien, R. Ramamurthy, J. Lux, T. Zhong, S. Harlson, E. Gillispie, T. Wilson, Adedapo Oni, A. Penumatcha, M. S. Kavrik, K. Maxey, A. Kozhakhmetov, C. C. Lin, S. Lee, A. Vyatskikh, N. Arefin, P. Fischer, J. Kevek, T. Tronic, M. Metz, S. B. Clendenning, U. Avci

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Novel Cell Architectures with Back-side Transistor Contacts for Scaling and Performance.

Mauro J. Kobrinsky, J. D. Silva, E. Mannebach, S. Mills, M. Abd El Qader, O. Adebayo, N. Arkali Radhakrishna, M. Beasley, J. Chawla, S. Chugh, A. Dasgupta, U. Desai, E. De Re, G. Dewey, T. Edwards, C. Engel, V. Gudmundsson, Jeffery Hicks, B. Krist, R. Mehandru, Inanc Meric, Patrick Morrow, D. Nandi, P. Patel, R. Ramamurthy, D. Samanta, L. Shoer, A. St Amour, L. H. Tan, Sukru Yemenicioglu, X. Wang, T. Ghani

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies.

K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Method to evaluate off-state breakdown in scaled Tri-gate technologies.

D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2022