R. Oh

According to our database, R. Oh authored at least 1 paper in 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2002

The impact of copper contamination on the quality of the second wire bonding process using X-ray photoelectron spectroscopy method.

T. Y. Lin, W. S. Leong, K. H. Chua, R. Oh, Y. Miao, J. S. Pan, J. W. Chai

Microelectron. Reliab., 2002