R. F. Szeloch

According to our database, R. F. Szeloch authored at least 3 papers between 2002 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform.

R. F. Szeloch, Pawel Janus, Jaroslaw Serafinczuk, P. M. Szecówka, Grzegorz Józwiak

Microelectron. Reliab., 2012

2011

Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD.

Artur Wiatrowski, W. M. Posadowski, Grzegorz Józwiak, Jaroslaw Serafinczuk, R. F. Szeloch, Teodor P. Gotszalk

Microelectron. Reliab., 2011

2002

Scanning Thermal Microscopy in Microsystem Reliability Analysis.

R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus

Microelectron. Reliab., 2002