Qingzhu Zhang

According to our database1, Qingzhu Zhang authored at least 13 papers between 2014 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
Disentangling the Influential Factors Driving NPP Decrease in Shandong Province: An Analysis from Time Series Evaluation Using MODIS and CASA Model.
Remote. Sens., June, 2024

Source/drain extension asymmetric counter-doping for suppressing channel leakage in stacked nanosheet transistors.
Microelectron. J., 2024

2023
Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors.
Microelectron. J., November, 2023

Ultralow-Power Compact Artificial Synapse Based on a Ferroelectric Fin Field-Effect Transistor for Spatiotemporal Information Processing.
Adv. Intell. Syst., November, 2023

Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications.
Sci. China Inf. Sci., October, 2023

2022
Deep Learning-Based Water Quality Retrieval in an Impounded Lake Using Landsat 8 Imagery: An Application in Dongping Lake.
Remote. Sens., 2022

Compound Label Learning for Affective Image Content Analysis.
Proceedings of the Artificial Intelligence - Second CAAI International Conference, 2022

2021
Investigation on negative capacitance FinEFT beyond 7 nm node from device to circuit.
Microelectron. J., 2021

A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018
Process variation dependence of total ionizing dose effects in bulk nFinFETs.
Microelectron. Reliab., 2018

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Microelectron. Reliab., 2018

2014
Ab <i>intio</i> Investigation of the Thermochemistry and Kinetics of the SO<sub>2</sub> + O<sub>3</sub><sup>-</sup> → SO<sub>3</sub><sup>-</sup> + O<sub>2</sub> Reaction in Aircraft Engines and the Environment.
Entropy, 2014


  Loading...