Qiao Teng

According to our database, Qiao Teng authored at least 2 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells.

Qiao Teng, Yongyu Wu, Junzhe Kang, Kai Xu, Dawei Gao

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress.

Xinze Li, Yuxuan Wu, Qiao Teng, Ying Sun, Xiao Gong, Guillaume Besnard, Christophe Maleville, Olivier Weber, Rui Zhang, Bing Chen, Dawei Gao, Ran Cheng

Proceedings of the International Conference on IC Design and Technology, 2023