Puyang Cai

According to our database, Puyang Cai authored at least 4 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.

Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM.

Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji

Proceedings of the IEEE International Reliability Physics Symposium, 2023

New Insights into Read Current Margin and Memory Window of HfO2-based Ferroelectric FET with Re-exploration of the Role of Ferroelectric Dynamics and Interface Charges during Readout.

Chang Su, Zhongxin Liang, Zhiyuan Fu, Shaodi Xu, Kaifeng Wang, Puyang Cai, Liang Chen, Ru Huang, Qianqian Huang

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2019

Recent progress in devices and circuits based on wafer-scale transition metal dichalcogenides.

Hongwei Tang, Haima Zhang, Xinyu Chen, Yin Wang, Xinzhi Zhang, Puyang Cai, Wenzhong Bao

Sci. China Inf. Sci., 2019