Pu Yi

According to our database, Pu Yi authored at least 10 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

JPF: From 2003 to 2023.

Cyrille Artho, Pavel Parízek, Daohan Qu, Varadraj Galgali, Pu (Luke) Yi

Proceedings of the Tools and Algorithms for the Construction and Analysis of Systems, 2024

Hierarchy-Aware Regression Test Prioritization.

Hao Wang, Pu (Luke) Yi, Jeremias Parladorio, Wing Lam, Darko Marinov, Tao Xie

Proceedings of the 35th IEEE International Symposium on Software Reliability Engineering, 2024

2023

Hardware-Aware Static Optimization of Hyperdimensional Computations.

Pu (Luke) Yi, Sara Achour

Proc. ACM Program. Lang., October, 2023

PBA: Percentile-Based Level Allocation for Multiple-Bits-Per-Cell RRAM.

Anjiang Wei, Akash Levy, Pu Yi, Robert M. Radway, Priyanka Raina, Subhasish Mitra, Sara Achour

Proceedings of the IEEE/ACM International Conference on Computer Aided Design, 2023

2022

A Theoretical Analysis of Random Regression Test Prioritization.

Pu Yi, Hao Wang, Tao Xie, Darko Marinov, Wing Lam

Proceedings of the Tools and Algorithms for the Construction and Analysis of Systems, 2022

Preempting Flaky Tests via Non-Idempotent-Outcome Tests.

Anjiang Wei, Pu Yi, Zhengxi Li, Tao Xie, Darko Marinov, Wing Lam

Proceedings of the 44th IEEE/ACM 44th International Conference on Software Engineering, 2022

The Stair Sketch: Bringing more Clarity to Memorize Recent Events.

Yikai Zhao, Yubo Zhang, Pu Yi, Tong Yang, Bin Cui, Steve Uhlig

Proceedings of the 38th IEEE International Conference on Data Engineering, 2022

2021

Finding Polluter Tests Using Java PathFinder.

Pu Yi, Anjiang Wei, Wing Lam, Tao Xie, Darko Marinov

ACM SIGSOFT Softw. Eng. Notes, 2021

Probabilistic and Systematic Coverage of Consecutive Test-Method Pairs for Detecting Order-Dependent Flaky Tests.

Anjiang Wei, Pu Yi, Tao Xie, Darko Marinov, Wing Lam

Proceedings of the Tools and Algorithms for the Construction and Analysis of Systems, 2021

Initial Results on Counting Test Orders for Order-Dependent Flaky Tests Using Alloy.

Wenxi Wang, Pu Yi, Sarfraz Khurshid, Darko Marinov

Proceedings of the Testing Software and Systems, 2021