Priyadharshini Shanmugasundaram
According to our database1,
Priyadharshini Shanmugasundaram
authored at least 3 papers
between 2011 and 2012.
Collaborative distances:
Collaborative distances:
Timeline
2011
2012
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1
2
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Bibliography
2012
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock.
Proceedings of the 25th International Conference on VLSI Design, 2012
2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
An efficient test data reduction technique through dynamic pattern mixing across multiple fault models.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011