Prashant Goteti

According to our database, Prashant Goteti authored at least 13 papers between 1996 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics.

Fei Su, Prashant Goteti, Min Zhang

Proceedings of the IEEE International Test Conference, 2020

2019

A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal Systems.

Rahul Kundu, Fei Su, Prashant Goteti

J. Electron. Test., 2019

On Freedom from Interference in Mixed-Criticality Systems: A Causal Learning Approach.

Fei Su, Prashant Goteti, Min Zhang

Proceedings of the IEEE International Test Conference, 2019

2018

Innovative practices on functional testing and fault simulation for FuSa.

Anandh Krishnan, John van Gelder, Mayukh Bhattacharya, Sreejit Chakravarty, Prashant Goteti

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Improving Analog Functional Safety Using Data-Driven Anomaly Detection.

Fei Su, Prashant Goteti

Proceedings of the IEEE International Test Conference, 2018

2017

Innovative practices session 6C DFT for functional safety.

Prashant Goteti, Sreejit Chakravarty

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

Fault simulation for analog test coverage.

Jyotsna Sequeira, Suriyaprakash Natarajan, Prashant Goteti, Nitin Chaudhary

Proceedings of the 2016 IEEE International Test Conference, 2016

2014

Innovative practices session 4C: Disruptive solutions in the non-digital world.

Amitava Majumdar, Suriya Natarajan, Stephen K. Sunter, Prashant Goteti, Ke Huang

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

2013

Framework for analog test coverage.

Debesh Bhatta, Ishita Mukhopadhyay, Suriyaprakash Natarajan, Prashant Goteti, Bin Xue

Proceedings of the International Symposium on Quality Electronic Design, 2013

Scalable and efficient analog parametric fault identification.

Mustafa Berke Yelten, Suriyaprakash Natarajan, Bin Xue, Prashant Goteti

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

1999

Test set selection for structural faults in analog IC's.

Giri Devarayanadurg, Mani Soma, Prashant Goteti, Sam D. Huynh

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1997

Analog and Mixed-Signal Benchmark Circuits-First Release.

Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs.

Giri Devarayanadurg, Prashant Goteti, Mani Soma

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996