Prashant D. Joshi

According to our database1, Prashant D. Joshi authored at least 11 papers between 2008 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of two.

Timeline

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Bibliography

2022
Aging Effects On Clock Gated Memory Phase Paths.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2020
Validation Challenges in Recent Trends of Power Management in Microprocessors.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019
High Performance Memory Repair.
Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2017
Tight Bounds in Message Delays Despite Faults in a Class of Line Digraph Networks.
Proceedings of the 14th International Symposium on Pervasive Systems, 2017

Region based containers - A new paradigm for the analysis of fault tolerant networks.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

2014
Line graph based fast rerouting and reconfiguration for handling transient and permanent node failures.
Proceedings of the IEEE 15th International Conference on High Performance Switching and Routing, 2014

Shortest path reduction in a class of uniform fault tolerant networks.
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

Security methods in fault tolerant modified line graph based networks.
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

Region Disjoint Paths in a Class of Optimal Line Graph Networks.
Proceedings of the 17th IEEE International Conference on Computational Science and Engineering, 2014

2013
Guest Editorial.
J. Electron. Test., 2013

2008
Error Detect Logic Resulting in Faster Address Generate and Decode for Caches.
Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008


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