Praneet Adusumilli

According to our database, Praneet Adusumilli authored at least 4 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

A Heterogeneous and Programmable Compute-In-Memory Accelerator Architecture for Analog-AI Using Dense 2-D Mesh.

Shubham Jain, Hsinyu Tsai, Ching-Tzu Chen, Ramachandran Muralidhar, Irem Boybat, Martin M. Frank, Stanislaw Wozniak, Milos Stanisavljevic, Praneet Adusumilli, Pritish Narayanan, Kohji Hosokawa, Masatoshi Ishii, Arvind Kumar, Vijay Narayanan, Geoffrey W. Burr

IEEE Trans. Very Large Scale Integr. Syst., 2023

2021

Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation.

Robert L. Bruce, Syed Ghazi Sarwat, Irem Boybat, Cheng-Wei Cheng, Wanki Kim, S. R. Nandakumar, Charles Mackin, Timothy Philip, Zuoguang Liu, Kevin Brew, Nanbo Gong, Injo Ok, Praneet Adusumilli, Katie Spoon, Stefano Ambrogio, Benedikt Kersting, Thomas Bohnstingl, Manuel Le Gallo, Andrew Simon, Ning Li, Iqbal Saraf, Jin-Ping Han, Lynne M. Gignac, John M. Papalia, Tenko Yamashita, Nicole Saulnier, Geoffrey W. Burr, Hsinyu Tsai, Abu Sebastian, Vijay Narayanan, Matthew BrightSky

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

Reliability Challenges with Materials for Analog Computing.

Eduard A. Cartier, Wanki Kim, Nanbo Gong, Tayfun Gokmen, Martin M. Frank, Douglas M. Bishop, Youngseok Kim, Seyoung Kim, Takashi Ando, Ernest Y. Wu, Praneet Adusumilli, John Rozen, Paul M. Solomon, Wilfried Haensch, Matthew J. BrightSky, Abu Sebastian, Geoffrey W. Burr, Vijay Narayanan

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Future on-chip interconnect metallization and electromigration.

Chao-Kun Hu, James J. Kelly, Huai Huang, Koichi Motoyama, Hosadurga Shobha, Yuri Ostrovski, James H.-C. Chen, Raghuveer Patlolla, Brown Peethala, Praneet Adusumilli, Terry A. Spooner, Roger Quon, Lynne M. Gignac, Chris M. Breslin, G. Lian, M. Ali, Jacob Benedict, X. S. Lin, S. Smith, Vimal Kamineni, X. Zhang, Frank Wilhelm Mont, Shariq Siddiqui, Frieder H. Baumann

Proceedings of the IEEE International Reliability Physics Symposium, 2018