Pranab K. Nag

According to our database, Pranab K. Nag authored at least 13 papers between 1988 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

DFM Evaluation Using IC Diagnosis Data.

Ronald Shawn Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

2013

DREAMS: DFM rule EvAluation using manufactured silicon.

Ronald D. Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

2002

Modeling the Economics of Testing: A DFT Perspective.

Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly

IEEE Des. Test Comput., 2002

2000

Cost based tradeoff analysis of standard cell designs.

Peng Li, Pranab K. Nag, Wojciech Maly

Proceedings of the Second IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2000), 2000

1998

Design-Manufacturing Interface: Part II - Applications.

Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, P. Simon

Proceedings of the 1998 Design, 1998

Design-Manufacturing Interface: Part I - Vision.

Wojciech Maly, Pranab K. Nag, Hans T. Heineken, Jitendra Khare

Proceedings of the 1998 Design, 1998

1997

To DFT or Not to DFT?

Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

CAD at the Design-Manufacturing Interface.

Hans T. Heineken, Jitendra Khare, Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Witold A. Pleskacz

Proceedings of the 34st Conference on Design Automation, 1997

1996

Design for manufacturability in submicron domain.

Wojciech Maly, Hans T. Heineken, Jitendra Khare, Pranab K. Nag

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

1995

Testability-oriented channel routing.

Jitendra Khare, Sujoy Mitra, Pranab K. Nag, U. Maly, Rob A. Rutenbar

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Hierarchical extraction of critical area for shorts in very large ICs.

Pranab K. Nag, Wojciech Maly

Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout.

Igor Bubel, Wojciech Maly, Thomas Waas, Pranab K. Nag, Hans Hartmann, Doris Schmitt-Landsiedel, Susanne Griep

Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

1988

Testing oriented analysis of CMOS ICs with opens.

Wojciech Maly, Pranab K. Nag, Phil Nigh

Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988