Prakash Periasamy

According to our database, Prakash Periasamy authored at least 2 papers in 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability.

Mukta G. Farooq, Giuseppe La Rosa, Fen Chen, Prakash Periasamy, Troy L. Graves-abe, Chandrasekharan Kothandaraman, C. Collins, W. Landers, J. Oakley, J. Liu, John Safran, S. Ghosh, S. Mittl, D. Ioannou, Carole Graas, Daniel Berger, Subramanian S. Iyer

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Diagnostic electromigration reliability evaluation with a local sensing structure.

Fen Chen, Erik McCullen, Cathryn Christiansen, Michael A. Shinosky, Roger Dufresne, Prakash Periasamy, Rick Kontra, Carole Graas, Gary StOnge

Proceedings of the IEEE International Reliability Physics Symposium, 2015