Praise O. Farayola

According to our database, Praise O. Farayola authored at least 12 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.

Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

IEEE Des. Test, October, 2023

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing.

Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

J. Electron. Test., February, 2023

2022

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing.

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

J. Electron. Test., December, 2022

The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the IEEE International Test Conference, 2022

Graph Theory Approach for Multi-site ATE Board Parameter Extraction.

Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the IEEE European Test Symposium, 2022

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing.

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing.

Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

IEEE Trans. Instrum. Meas., 2021

Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the IEEE International Test Conference, 2021

An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.

Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the 26th IEEE European Test Symposium, 2021

Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation.

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020

Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.

Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

Proceedings of the 38th IEEE VLSI Test Symposium, 2020