Pradeep Lall

According to our database, Pradeep Lall authored at least 18 papers between 2007 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Cell Lifetime Degradation Model Development for Li-Ion Coin Cells considering Calendar Aging and Post-Knee Degradation (Invited).

Pradeep Lall, Ved Soni

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Estimation of SOH Degradation of Coin Cells Subjected to Accelerated Life Cycling with Randomized Cycling Depths and C-Rates.

Pradeep Lall, Ved Soni, Guneet Sethi, Kok Yiang

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2018

PHM of state-of-charge for flexible power sources in wearable electronics with EKF.

Pradeep Lall, Hao Zhang, Rahul Lall

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Prognostics health management of electronic systems - A reliability physics approach.

Pradeep Lall, Kazi Mirza, David Locker

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging.

Muhannad Mustafa, Jeffrey C. Suhling, Pradeep Lall

Microelectron. Reliab., 2016

High strain rate constitutive behavior of SAC105 and SAC305 leadfree solder during operation at high temperature.

Pradeep Lall, Di Zhang, Vikas Yadav, David Locker

Microelectron. Reliab., 2016

Prognostication of remaining useful-life for flexible batteries in foldable wearable electronics.

Pradeep Lall, Hao Zhang

Proceedings of the IEEE International Conference on Prognostics and Health Management, 2016

ANN based RUL assessment for copper-aluminum wirebonds subjected to harsh environments.

Pradeep Lall, Shantanu Deshpande, Luu Nguyen

Proceedings of the IEEE International Conference on Prognostics and Health Management, 2016

2015

Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging.

Pradeep Lall, Peter Sakalaukus, Lynn Davis

IEEE Access, 2015

Prognostication of LED remaining useful life and color stability in the presence of contamination.

Pradeep Lall, Hao Zhang, Lynn Davis

Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015

Prognostication of solder-joint reliability of 0.4mm and 0.5mm pitch bgas subjected to mechanical shocks up to 10, 000G.

Pradeep Lall, Kalyan Dornala, Junchao Wei, Ryan Lowe, Jason Foley

Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015

2012

Extended Kalman Filter Models and Resistance Spectroscopy for Prognostication and Health Monitoring of Leadfree Electronics Under Vibration.

Pradeep Lall, Ryan Lowe, Kai Goebel

IEEE Trans. Reliab., 2012

Decorrelated Feature Space and Neural Nets Based Framework for Failure Modes Clustering in Electronics Subjected to Mechanical Shock.

Pradeep Lall, Prashant Gupta, Kai Goebel

IEEE Trans. Reliab., 2012

Prognostics Health Management of Electronic Systems Under Mechanical Shock and Vibration Using Kalman Filter Models and Metrics.

Pradeep Lall, Ryan Lowe, Kai Goebel

IEEE Trans. Ind. Electron., 2012

2011

Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical Loads.

Pradeep Lall, Chandan Bhat, Madhura Hande, Vikrant More, Rahul Vaidya, Kai Goebel

IEEE Trans. Ind. Electron., 2011

Guest Editorial.

Robert Neal Dean, Pradeep Lall, Mathias Nowottnick, William R. Harrell

IEEE Trans. Ind. Electron., 2011

2009

Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads.

Pradeep Lall, Madhura Hande, Chandan Bhat, Vikrant More, Rahul Vaidya

Microelectron. Reliab., 2009

2007

Feature extraction and damage-precursors for prognostication of lead-free electronics.

Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Jeff Suhling, Jay Lee

Microelectron. Reliab., 2007