Pon Sung Ku

According to our database, Pon Sung Ku authored at least 2 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

Impact of stress-induced backflow on full-chip electromigration risk assessment.

Haldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

2004

A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification.

Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004