Pon Sung Ku

According to our database1, Pon Sung Ku authored at least 2 papers between 2004 and 2006.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2006
Impact of stress-induced backflow on full-chip electromigration risk assessment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

2004
A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification.
Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004


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