Po-Yao Lin
Orcid: 0000-0001-6137-9948
According to our database1,
Po-Yao Lin
authored at least 2 papers
between 2018 and 2022.
Collaborative distances:
Collaborative distances:
Timeline
2018
2019
2020
2021
2022
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1
2
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Bibliography
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2018
SiO<sub>2</sub> tunneling and Si<sub>3</sub>N<sub>4</sub>/HfO<sub>2</sub> trapping layers formed with low temperature processes on gate-all-around junctionless charge-trapping flash memory devices.
Microelectron. Reliab., 2018