Plamen Asenov

According to our database, Plamen Asenov authored at least 9 papers between 2011 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology.

Leitao Liu, Jingtian Fang, Ashish Pal, Plamen Asenov, Mohit Bajaj, Bei Deng, Xi-Wei Lin, Souvik Mahapatra, Subi Kengeri, El Mehdi Bazizi

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development.

Xi-Wei Lin, Salvatore M. Amoroso, Ko-Hsin Lee, Meng Hsuan Ke, Tue Gunst, Pavel Tikhomirov, Plamen Asenov

Proceedings of the IEEE International Memory Workshop, 2024

2023

Exploring Power Savings of Gate-All-Around Cryogenic Technology.

Victor Moroz, Alexei Svizhenko, Munkang Choi, Plamen Asenov, Jaehyun Lee

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2017

TCAD based Design-Technology Co-Optimisations in advanced technology nodes.

Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma

Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017

2016

Nanowire transistor solutions for 5nm and beyond.

A. Asenov, Yangang Wang, Binjie Cheng, Xingsheng Wang, Plamen Asenov, Talib Al-Ameri, Vihar P. Georgiev

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

2015

Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.

A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2013

Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.

Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov

Proceedings of 2013 International Conference on IC Design & Technology, 2013

2012

An advanced statistical compact model strategy for SRAM simulation at reduced VDD.

Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011

Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.

Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov

Proceedings of the Design, Automation and Test in Europe, 2011