Pieter Blomme
According to our database1,
Pieter Blomme
authored at least 3 papers
between 2011 and 2019.
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Bibliography
2019
Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2012
Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories.
Microelectron. Reliab., 2012
2011
Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness.
Microelectron. Reliab., 2011