Pierre Thorel

According to our database, Pierre Thorel authored at least 6 papers between 1991 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

TER: A Robot for Remote Ultrasonic Examination: Experimental Evaluations

Jean-Jacques Banihachemi, Eric Boidard, Jean-Luc Bosson, Luc Bressollette, Ivan Bricault, Philippe Cinquin, Gilbert Ferretti, Maud Marchal, Thomas Martinelli, Alexandre Moreau-Gaudry, Franck Pellissier, Christian Roux, Dominique Saragaglia, Pierre Thorel, Jocelyne Troccaz, Adriana Vilchis Gonzales

CoRR, 2008

2002

Experiments with the TER Tele-echography Robot.

Adriana Vilchis Gonzales, Jocelyne Troccaz, Philippe Cinquin, Agnès Guerraz, Franck Pellissier, Pierre Thorel, Bertrand Tondu, Fabien Courreges, Gérard Poisson, Marc Althuser, Jean-Marc Ayoubi

Proceedings of the Medical Image Computing and Computer-Assisted Intervention, 2002

A Haptic Command Station for Remote Ultrasound Examinations.

Agnès Guerraz, Bernard Hennion, Pierre Thorel, Franck Pellissier, Alexandre Vienne, Ismael Belghit

Proceedings of the 10th Symposium on Haptic Interfaces for Virtual Environment and Teleoperator Systems, 2002

2001

TER: A System for Robotic Tele-echography.

Adriana Vilchis Gonzales, Philippe Cinquin, Jocelyne Troccaz, Agnès Guerraz, Bernard Hennion, Franck Pellissier, Pierre Thorel, Fabien Courreges, Alain Gourdon, Gérard Poisson, Pierre Vieyres, Pierre Caron, Olivier Mérigeaux, Loïc Urbain, Cédric Daimo, Stéphane Lavallée, Philippe Arbeille, Marc Althuser, Jean-Marc Ayoubi, Bertrand Tondu, Serge Ippolito

Proceedings of the Medical Image Computing and Computer-Assisted Intervention, 2001

1992

A high-speed CMOS circuit for 1.2-Gb/s 16*16 ATM switching.

Alain Chemarin, Alain André, Alain Botta, Jacques Majos, Jean-Luc Rainard, Henri Teyssier, Pierre Thorel

IEEE J. Solid State Circuits, July, 1992

1991

Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch.

Pierre Thorel, Jean-Luc Rainard, Alain Botta, Alain Chemarin, Jacques Majos

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991