Pierre Fazan
According to our database1,
Pierre Fazan
authored at least 11 papers
between 2005 and 2022.
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Bibliography
2022
High Performance Thermally Resistant FinFETs DRAM Peripheral CMOS FinFETs with VTH Tunability for Future Memories.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2019
Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration.
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
2013
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors.
Proceedings of the European Solid-State Device Research Conference, 2013
2012
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2005
Proceedings of the 13th IEEE International Workshop on Memory Technology, 2005