Piero Olivo

According to our database, Piero Olivo authored at least 67 papers between 1988 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays.

Artem Glukhov, Nicola Lepri, Valerio Milo, Andrea Baroni, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini

Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022

Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory.

Piergiulio Mannocci, Andrea Baroni, Enrico Melacarne, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators.

Artem Glukhov, Valerio Milo, Andrea Baroni, Nicola Lepri, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Optimized programming algorithms for multilevel RRAM in hardware neural networks.

Valerio Milo, Francesco Anzalone, Cristian Zambelli, Eduardo Pérez, Mamathamba Kalishettyhalli Mahadevaiah, Oscar Gonzalez Ossorio, Piero Olivo, Christian Wenger, Daniele Ielmini

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives.

Lorenzo Zuolo, Cristian Zambelli, Alessia Marelli, Rino Micheloni, Piero Olivo

IEEE Trans. Emerg. Top. Comput., 2019

Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD.

Cristian Zambelli, Riccardo Bertaggia, Lorenzo Zuolo, Rino Micheloni, Piero Olivo

IEEE Trans. Circuits Syst. II Express Briefs, 2019

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing.

Mamathamba Kalishettyhalli Mahadevaiah, Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Finn Zahari, Hermann Kohlstedt, Martin Ziegler

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Low-energy inference machine with multilevel HfO2 RRAM arrays.

Valerio Milo, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Oscar Gonzalez Ossorio, Christian Wenger, Daniele Ielmini

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM.

Alessandro Grossi, Elisa Vianello, Cristian Zambelli, Pablo Royer, Jean-Philippe Noel, Bastien Giraud, Luca Perniola, Piero Olivo, Etienne Nowak

IEEE Trans. Very Large Scale Integr. Syst., 2018

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay

IEEE Trans. Emerg. Top. Comput., 2018

Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage.

Francesco Pieri, Cristian Zambelli, Andrea Nannini, Piero Olivo, Sergio Saponara

IEEE Consumer Electron. Mag., 2018

Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs.

Cristian Zambelli, Marco Castellari, Piero Olivo, Davide Bertozzi

Proceedings of the 2018 New Generation of CAS, 2018

2017

Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance.

Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Piero Olivo

Proc. IEEE, 2017

Solid-State Drives (SSDs) [Scanning the Issue].

Rino Micheloni, Piero Olivo

Proc. IEEE, 2017

Architectural and Integration Options for 3D NAND Flash Memories.

Rino Micheloni, Luca Crippa, Cristian Zambelli, Piero Olivo

Comput., 2017

2016

Reliability of 3D NAND Flash Memories.

Alessandro Grossi, Cristian Zambelli, Piero Olivo

Proceedings of the 3D Flash Memories, 2016

2015

Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers.

Davide Bertozzi, Stefano Di Carlo, Salvatore Galfano, Marco Indaco, Piero Olivo, Paolo Prinetto, Cristian Zambelli

ACM Trans. Embed. Comput. Syst., 2015

SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives.

Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Marco Indaco, Stefano Di Carlo, Paolo Prinetto, Davide Bertozzi, Piero Olivo

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Design space exploration of latency and bandwidth in RRAM-based solid state drives.

Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Stephen Bates, Piero Olivo

Proceedings of the 15th Non-Volatile Memory Technology Symposium, 2015

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 15th Non-Volatile Memory Technology Symposium, 2015

RRAM Reliability/Performance Characterization through Array Architectures Investigations.

Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Automated characterization of TAS-MRAM test arrays.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2014

FLARES: An Aging Aware Algorithm to Autonomously Adapt the Error Correction Capability in NAND Flash Memories.

Stefano Di Carlo, Salvatore Galfano, Marco Indaco, Paolo Prinetto, Davide Bertozzi, Piero Olivo, Cristian Zambelli

ACM Trans. Archit. Code Optim., 2014

SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives.

Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Salvatore Galfano, Marco Indaco, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, Davide Bertozzi

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems.

Lorenzo Zuolo, Gabriele Miorandi, Cristian Zambelli, Piero Olivo, Davide Bertozzi

Proceedings of the 2013 International Symposium on System on Chip, 2013

2012

Modeling of SET seasoning effects in Phase Change Memory arrays.

Cristian Zambelli, Andrea Chimenton, Piero Olivo

Microelectron. Reliab., 2012

A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories.

Cristian Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, Davide Bertozzi

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Nonvolatile Memory Partitioning Scheme for Technology-Based Performance-Reliability Tradeoff.

Cristian Zambelli, Davide Bertozzi, Andrea Chimenton, Piero Olivo

IEEE Embed. Syst. Lett., 2011

2006

Improving performance and reliability of NOR-Flash arrays by using pulsed operation.

Andrea Chimenton, Fernanda Irrera, Piero Olivo

Microelectron. Reliab., 2006

2005

Reliability of erasing operation in NOR-Flash memories.

Andrea Chimenton, Piero Olivo

Microelectron. Reliab., 2005

2003

Overerase phenomena: an insight into flash memory reliability.

Andrea Chimenton, Paolo Pellati, Piero Olivo

Proc. IEEE, 2003

2001

Automated test equipment for research on nonvolatile memories.

Paolo Pellati, Piero Olivo

IEEE Trans. Instrum. Meas., 2001

1998

A Bist Scheme for Non-Volatile Memories.

Piero Olivo, Marcello Dalpasso

J. Electron. Test., 1998

1997

On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits.

Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

Flash memory cells-an overview.

Paolo Pavan, Roberto Bez, Piero Olivo, Enrico Zanoni

Proc. IEEE, 1997

1996

Modeling and simulation of broken connections in CMOS IC's.

Michele Favalli, Marcello Dalpasso, Piero Olivo

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

Self-Learning Signature Analysis for Non-Volatile Memory Testing.

Piero Olivo, Marcello Dalpasso

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults.

Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò

J. Electron. Test., 1995

Test pattern generation for I_DDQ: increasing test quality.

Marcello Dalpasso, Michele Favalli, Piero Olivo

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Reliability evaluation of combinational logic circuits by symbolic simulation.

Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Riccò

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Correlation between I_DDQ testing quality and sensor accuracy.

Marcello Dalpasso, Michele Favalli, Piero Olivo

Proceedings of the 1995 European Design and Test Conference, 1995

1994

Modeling of Broken Connections Faults in CMOS ICs.

Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò

Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994

1993

Analysis of resistive bridging fault detection in BiCMOS digital ICs.

Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò

IEEE Trans. Very Large Scale Integr. Syst., 1993

Fault simulation of parametric bridging faults in CMOS IC's.

Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993

Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs.

Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

A Highly Testable 1-out-of-3 CMOS Checker.

Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò

Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993

Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block.

Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò

Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993

1992

A probabilistic fault model for 'analog' faults in digital CMOS circuits.

Michele Favalli, Piero Olivo, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Testability measures in pseudorandom testing.

Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Dynamic effects in the detection of bridging faults in CMOS ICs.

Michele Favalli, Piero Olivo, Bruno Riccò

J. Electron. Test., 1992

CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults.

Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs.

Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs.

Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

A novel critical path heuristic for fast fault grading.

Michele Favalli, Piero Olivo, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

Fault simulation of unconventional faults in CMOS circuits.

Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

Analysis and Design of Linear Finite State Machines for Signature Analysis Testing.

Maurizio Damiani, Piero Olivo, Bruno Riccò

IEEE Trans. Computers, 1991

Fault simulation for general FCMOS ICs.

Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi

J. Electron. Test., 1991

A probabilistic fault model for analog faults.

Michele Favalli, Piero Olivo, Bruno Riccò

Proceedings of the conference on European design automation, 1991

Detection of PLA multiple crosspoint faults.

M. Ambanelli, Michele Favalli, Piero Olivo, Bruno Riccò

Proceedings of the conference on European design automation, 1991

1990

Aliasing in signature analysis testing with multiple input shift registers.

Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990

Testing of E²PROM aging and endurance: A case study.

Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt

Eur. Trans. Telecommun., 1990

1989

An analytical model for the aliasing probability in signature analysis testing.

Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989

On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing.

Piero Olivo, Maurizio Damiani, Bruno Riccò

Proceedings of the Proceedings International Test Conference 1989, 1989

A Testing Technique to Characterize E^2PROM's Aging and Endurance.

Massimo Lanzoni, Piero Olivo, Bruno Riccò

Proceedings of the Proceedings International Test Conference 1989, 1989

CMOS Design for Improved IC Testability.

Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò

Proceedings of the Proceedings International Test Conference 1989, 1989

Improved testability evaluations in combinational logic networks.

Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò

Proceedings of the Computer Design: VLSI in Computers and Processors, 1989

1988

Aliasing errors in signature analysis testing of integrated circuits.

Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò

Proceedings of the Computer Design: VLSI in Computers and Processors, 1988