Philippe Perdu

According to our database, Philippe Perdu authored at least 80 papers between 2001 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Automatic localization of signal sources in photon emission images for integrated circuit analysis.

Anthony Boscaro, Sabir Jacquir, Samuel Chef, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Signal Image Video Process., 2018

2017

Pattern image enhancement by automatic focus correction.

Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Microelectron. Reliab., 2017

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory.

Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Proceedings of the 20th International Conference on Information Fusion, 2017

2016

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.

Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan

Microelectron. Reliab., 2016

Automatic process for time-frequency scan of VLSI.

Anthony Boscaro, Sabir Jacquir, Kevin Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Microelectron. Reliab., 2016

2015

A way to implement the electro-optical technique to inertial MEMS.

Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2015

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization.

Nicolas Courjault, Philippe Perdu, Fulvio Infante, Thierry Lebey, Vincent Bley

Microelectron. Reliab., 2015

Unsupervised learning for signal mapping in dynamic photon emission.

Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan

Microelectron. Reliab., 2015

Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering.

Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Microelectron. Reliab., 2015

Editorial.

Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier

Microelectron. Reliab., 2015

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location.

Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

J. Electronic Imaging, 2015

2014

A comprehensive study of the application of the EOP techniques on bipolar devices.

Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2014

Backside spectroscopic photon emission microscopy using intensified silicon CCD.

Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki

Microelectron. Reliab., 2014

Pattern image enhancement by extended depth of field.

Samuel Chef, Bastien Billiot, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Microelectron. Reliab., 2014

2013

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.

I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu

Microelectron. Reliab., 2013

Frequency mapping in dynamic light emission with wavelet transform.

Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak

Microelectron. Reliab., 2013

2012

Optimum Si thickness for backside detection of photon emission using Si-CCD.

Arkadiusz Glowacki, Christian Boit, Philippe Perdu

Microelectron. Reliab., 2012

High performance thermography with InGaAs photon counting camera.

Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis

Microelectron. Reliab., 2012

2011

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.

Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis

Microelectron. Reliab., 2011

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.

Arkadiusz Glowacki, Christian Boit, Philippe Perdu

Microelectron. Reliab., 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.

Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2011

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.

Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis

Microelectron. Reliab., 2011

2010

VLSI functional analysis by dynamic emission microscopy.

Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura

Microelectron. Reliab., 2010

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations.

Fulvio Infante, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2010

CADless laser assisted methodologies for failure analysis and device reliability.

A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis

Microelectron. Reliab., 2010

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).

Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2010

When Failure Analysis Meets Side-Channel Attacks.

Jerome Di-Battista, Jean-Christophe Courrège, Bruno Rouzeyre, Lionel Torres, Philippe Perdu

Proceedings of the Cryptographic Hardware and Embedded Systems, 2010

2009

Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics.

F. Molière, B. Foucher, Philippe Perdu, Alain Bravaix

Microelectron. Reliab., 2009

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.

Fulvio Infante, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2009

2008

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.

Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis

Microelectron. Reliab., 2008

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology.

Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier

Microelectron. Reliab., 2008

Dynamic study of the thermal laser stimulation response on advanced technology structures.

Antoine Reverdy, M. de la Bardonnie, Patrick Poirier, H. Murray, Philippe Perdu, A. Boukkali

Microelectron. Reliab., 2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

Generic simulator for faulty IC.

Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier

Microelectron. Reliab., 2008

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques.

Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Philippe Perdu, J. C. Clement, Benoit Lambert, M. Bonnet

Microelectron. Reliab., 2008

2007

Long-term reliability of silicon bipolar transistors subjected to low constraints.

A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez

Microelectron. Reliab., 2007

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC.

Mohsine Bouya, D. Carisetti, Nathalie Malbert, Nathalie Labat, Philippe Perdu, J. C. Clement, M. Bonnet, G. Pataut

Microelectron. Reliab., 2007

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications.

Felix Beaudoin, Kevin Sanchez, Philippe Perdu

Microelectron. Reliab., 2007

Identification of process/design issues during 0.18 µm technology qualification for space application.

Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.

Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2006

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.

Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin

Microelectron. Reliab., 2006

2005

NIR laser stimulation for dynamic timing analysis.

Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis

Microelectron. Reliab., 2005

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.

Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit

Microelectron. Reliab., 2005

Oxide charge measurements in EEPROM devices.

C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier

Microelectron. Reliab., 2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2005

Impact of semiconductors material on IR Laser Stimulation signal.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2005

Failure analysis of micro-heating elements suspended on thin membranes.

Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu

Microelectron. Reliab., 2005

Dynamic Laser Stimulation Case Studies.

Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte

Microelectron. Reliab., 2005

Electrical Modeling for Laser Testing with Different Pulse Durations.

Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

Implementation of TRE systems into Emission Microscopes.

Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu

Microelectron. Reliab., 2004

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?

Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis

Microelectron. Reliab., 2004

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.

Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas

Microelectron. Reliab., 2004

Understanding the effects of NIR laser stimulation on NMOS transistor.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2004

Study of the ESD defects impact on ICs reliability.

Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2004

Time Resolved Photon Emission Processing Flow for IC Analysis.

Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti

Microelectron. Reliab., 2004

Femtosecond Laser Ablation for Backside Silicon Thinning.

Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu

Microelectron. Reliab., 2004

2003

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.

David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères

Microelectron. Reliab., 2003

Solar Cell Analysis with Light Emission and OBIC Techniques.

Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2003

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.

Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2003

Short defect characterization based on TCR parameter extraction.

Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis

Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.

Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari

Microelectron. Reliab., 2003

Magnetic emission mapping for passive integrated components characterisation.

Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina

Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).

Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

Fault Localization using Time Resolved Photon Emission and STIL Waveforms.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

IR confocal laser microscopy for MEMS Technological Evaluation.

Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats

Microelectron. Reliab., 2002

Magnetic field measurements for Non Destructive Failure Analysis.

Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali

Microelectron. Reliab., 2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.

Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.

Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis

Microelectron. Reliab., 2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.

Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement

Microelectron. Reliab., 2002

2001

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.

Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2001

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.

Romain Desplats, Philippe Perdu, Felix Beaudoin

Microelectron. Reliab., 2001

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis

Microelectron. Reliab., 2001

Silicon Thinning and Polishing on Packaged Devices.

Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis

Microelectron. Reliab., 2001

Modeling Thermal Laser Stimulation.

Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2001

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology.

Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu

IEEE J. Solid State Circuits, 2001