Philippe Nivelle
Orcid: 0000-0002-7788-644X
According to our database1,
Philippe Nivelle
authored at least 2 papers
between 2018 and 2021.
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Bibliography
2021
Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real Time as a Tool for Sensing Applications.
IEEE Trans. Instrum. Meas., 2021
2018
Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules.
Proceedings of the IEEE International Reliability Physics Symposium, 2018